I have WD elements 2TB. I have tried to erase or format it but without success. Took long time, more than 3 days but nothing happens. The progress is stuck on 1%.
Also with try check bad sectors won't continue after 30 minutes
:~$ sudo badblocks -svw -o badblocks.log /dev/sdc
Checking for bad blocks in read-write mode
From block 0 to 1953481727
Testing with pattern 0xaa: 0.01% done, 31:34 elapsed. (0/0/0 errors)
And here is output of (smartctl --all)
~$ sudo smartctl --all /dev/sdd
smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-52-generic] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Elements / My Passport (USB, AF)
Device Model: WDC WD20NMVW-11AV3S2
Serial Number: WD-WX21E949F5A4
LU WWN Device Id: 5 0014ee 20b794cca
Firmware Version: 01.01A01
User Capacity: 2,000,398,934,016 bytes [2.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5200 rpm
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Nov 3 23:08:31 2022 +03
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART Status not supported: Incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
Warning: This result is based on an Attribute check.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (37620) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 415) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x7035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 49
3 Spin_Up_Time 0x0027 216 193 021 Pre-fail Always - 4166
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 1535
5 Reallocated_Sector_Ct 0x0033 133 133 140 Pre-fail Always FAILING_NOW 2805
7 Seek_Error_Rate 0x002e 001 001 000 Old_age Always - 40614
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 2221
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1407
192 Power-Off_Retract_Count 0x0032 199 199 000 Old_age Always - 1370
193 Load_Cycle_Count 0x0032 187 187 000 Old_age Always - 40166
194 Temperature_Celsius 0x0022 107 101 000 Old_age Always - 45
196 Reallocated_Event_Count 0x0032 002 001 000 Old_age Always - 198
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 100 253 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 7 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 7 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
ef 02 00 00 00 00 00 00 00:01:23.524 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
Error 6 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
04 61 06 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
ef 90 06 00 00 00 00 00 00:01:23.524 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
Error 5 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
04 61 02 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
e1 00 02 00 00 00 00 00 00:01:23.524 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:23.523 IDENTIFY DEVICE
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
Error 4 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
04 61 0f 00 00 00 00
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
e1 00 0f 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
Error 3 occurred at disk power-on lifetime: 2167 hours (90 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
04 61 00 00 00 00 00 Device Fault; Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
ef 02 00 00 00 00 00 00 00:01:22.579 SET FEATURES [Enable write cache]
ef 90 06 00 00 00 00 00 00:01:22.579 SET FEATURES [Disable SATA feature]
e1 00 02 00 00 00 00 00 00:01:22.579 IDLE IMMEDIATE
ec 00 01 00 00 00 00 00 00:01:22.578 IDENTIFY DEVICE
b0 d0 00 00 4f c2 00 00 00:00:17.757 SMART READ DATA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Is it dead or can I fix it ?!!
P.S: I am using Ubuntu 22.04
overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA.
What other confirmation would you need? – Marcus Müller Nov 03 '22 at 20:17